Published in: LIPIcs, Volume 271, 26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023)
Dror Fried, Alexander Nadel, and Yogev Shalmon. AllSAT for Combinational Circuits. In 26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023). Leibniz International Proceedings in Informatics (LIPIcs), Volume 271, pp. 9:1-9:18, Schloss Dagstuhl – Leibniz-Zentrum für Informatik (2023)
@InProceedings{fried_et_al:LIPIcs.SAT.2023.9, author = {Fried, Dror and Nadel, Alexander and Shalmon, Yogev}, title = {{AllSAT for Combinational Circuits}}, booktitle = {26th International Conference on Theory and Applications of Satisfiability Testing (SAT 2023)}, pages = {9:1--9:18}, series = {Leibniz International Proceedings in Informatics (LIPIcs)}, ISBN = {978-3-95977-286-0}, ISSN = {1868-8969}, year = {2023}, volume = {271}, editor = {Mahajan, Meena and Slivovsky, Friedrich}, publisher = {Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik}, address = {Dagstuhl, Germany}, URL = {https://drops.dagstuhl.de/entities/document/10.4230/LIPIcs.SAT.2023.9}, URN = {urn:nbn:de:0030-drops-184717}, doi = {10.4230/LIPIcs.SAT.2023.9}, annote = {Keywords: AllSAT, SAT, Circuits} }
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